Physics of Semiconductor Materials and Devices
A tantárgyleírás hatályossága
| Subject name (Hungarian, English) |
Félvezető anyagok és eszközök fizikája
Physics of Semiconductor Materials and Devices
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| Subject code | BMEVIEEDK01 | ||||||||||||
| Subject type | — | ||||||||||||
| Training Level | — | ||||||||||||
| Course types and hours (weekly/semester) |
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| Assessment type | vizsga | ||||||||||||
| Credits | 5 | ||||||||||||
| Subject coordinator |
DR. Neumann Péter Lajos
position: adjunktus
contact:
neumann.peter@vik.bme.hu
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| Responsible department |
Elektronikus Eszközök Tanszéke
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| Faculty | Villamosmérnöki és Informatikai Kar | ||||||||||||
| Subject website | — | ||||||||||||
| Primary curriculum type | — | ||||||||||||
| Direct prerequisites – Strong prerequisite | none | ||||||||||||
| Direct prerequisites – Weak prerequisite | none | ||||||||||||
| Direct prerequisites – Parallel prerequisite | none | ||||||||||||
| Direct prerequisites – Milestone prerequisite | none | ||||||||||||
| Direct prerequisites – Exclusion | none |
Objectives
1. Electrons in solid states. Density of states, occupation of states.
Basic lattice structures. Reciprocal lattice. Surfaces and interfaces.
Scattering mechanisms. Elektrons in the periodic potencial space.
2. Semiconductor band structures. Band structures of heterojunctions,
quantum wells and super lattices. Changing of the band structure under
mechanical stress.
3. Doping of semiconductors, highly doped semiconductors. Vibration of
the lattice, phonons, phonon statistics, phonons in heterojunctions. Transport
phenomena, Boltzmann equation. Scattering on crystal defects, on doping atoms
and charge carriers.
4. Velocity-fieldstrength relations, transport of charge carriers.
Ballistic transport at very small dimensions. Phenomenon of overshooting.
Transport phenomena in heterojunctions, in quantum structures and
superlattices. Generation, direct and indirect rekombination. Tunnel effect,
tunnal current. Interaction of semiconductors and phonons. Intraband and
interband transitions. Semiconductors in magnetic field. Lattice defects.
5. The pn junction. Band
diagram.. Depleted layer and capacity at different doping profiles. Current-Voltage
characteristics. Secondary effects in forward direction. Rekombination current
in the depletion layer. Series resistance and its modulation. High-level
injection. Current crowding. Ideality factor. Secondary effects under reverse
bias. Generation current in the
depletion layer. Avalanche breakdown, avalanche voltage. The effect of
curvature on the breakdown voltage.
6. Thermal resistance, thermal runaway. Small-signal circuit diagram,
the frequency dependence of the small-signal admittance. Switching behaviour of the pn junction.
Switching times and factors influencing them.
7.The PIN diode. Structure, behaviour in forward and reverse
directions, breakdown voltage, small-signal admittance, cut-off frequency.
Metal-semiconductor junction. Schotttky diode. Structure, currents, properties.
Ohmic metal-semiconductor junctions. N-n type heterojunction as high-speed
switch. Bulk-barrier diode.
8. The bipolar transistor.
Structure, basic operation, characteristics. Dependence of the current
amplification factor upon the operating point, recombination current,
high-level injection. Current crowding. Breakdown voltages. Punch-through
voltage. Optimization of homogeneous and inhomogeneous base transistors.
9. Small-signal behaviour and circuit diagrams. Cut-off frequencies and
their dependence upon the structure of the device. Possibilities for increasing
of the cut-off frequencies by optimal constructions. Switching properties of the bipolar
transistor. Determination of the switching times.
10. The heterojunction bipolar transistor (HBT). The effect of the
emitter.base heterijunction upon the emitter efficiency. Optimization
possibilities to increase the cut-off frequencies. Different types of HBT-s. Compound semiconductor,
SiGe HBT, polisilicon-emitter
transistor.
11. Tyristors. Structures,
operation, characteristics, parameters. Dependence of the current amplification
factor upon the current and its effect upon the I-V chaacteristics.. The
problem of dU/dt and dI/dt. Transient processes.
12. The MOS structure.
Accumulation, depletion, inversion, deep depletion. Relation between the
surface field strength and surface potential. Threshold voltage. Dependence of
the MOS capacitance upon the operating
point and the frequency. Capacity transient. Structure and operation of the MOS
FET. Current-voltage characteristics and its regions.
Learning outcomes
Ez a tantárgy a KKK rendeletben meghatározott, következő kompetenciák fejlesztését szolgálja:
Knowledge
No learning outcomes recorded.
Skills
No learning outcomes recorded.
Attitudes
No learning outcomes recorded.
Autonomy and responsibility
No learning outcomes recorded.
Oktatási módszertan
Tanulástámogató anyagok
Online források
Recommended preliminary knowledge for completing the subject
General rules
Assessment methods
In-term assessments
No detailed assessments provided.
Weight of in-term assessments
No weights provided.
Exam-period assessments
No detailed assessments provided.
Weight of exam elements
No weights provided.
Grade calculation
No grade thresholds provided.
Attendance requirements
No attendance requirements provided.
Rules for retake and resubmission
Not provided.
Short description
Not provided.
Detailed description
Not provided.
Recommended courses
Not provided.
Workload to complete the subject
No workload breakdown provided.
Validity of subject requirements
Curriculum placement
No curriculum placements recorded for this subject version.